Peb -dimensional optical profilometer ua tiav micrometer mus rau nanometer qib precision ntsuas los ntawm kev cuam tshuam lub teeb dawb lossis confocal thev naus laus zis, thiab tshuaj xyuas peb -dimensional morphology, roughness, thiab contour ntawm cov khoom siv khoom. Cov cuab yeej no tsis muaj -cov yam ntxwv ntsuas kev sib cuag, zam kev puas tsuaj rau qhov ntsuas qhov saum npoo, thiab tsim nyog rau ntau hom ntaub ntawv xws li pob tshab / hlau / siab xav. Hauv kev lag luam ntawm kev tsim khoom, semiconductors, aerospace, thiab lwm yam, 3D optical profilometers tau siv dav hauv kev tswj xyuas, kev saib xyuas, thiab kev tsim khoom.
Los ntawm 2025, cov qauv tseem ceeb xws li ZeGage Pro thiab SuperViewW1 yuav muaj ob qho tib si seismic kev ua tau zoo thiab kev ntsuas kev siv lub peev xwm, nrog kev ntsuas qhov tseeb tshaj 0.1nm qib. Cov cuab yeej ua haujlwm suav nrog kev tshuaj xyuas micro morphology, kev suav curvature, thiab cov yeeb yaj kiab nyias pom, uas ua raws li ISO 25178 tus qauv thiab tau dhau los ua cov cuab yeej tshawb nrhiav tseem ceeb rau niaj hnub precision manufacturing.
